By DE Editors
Photon, part of Ophir Photonics, announced NanoScan v2, the newest version of the company’s scanning slit beam profiler. NanoScan is a NIST-calibrated laser beam profiler, which uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts. The new version adds an enhanced graphical user interface (GUI) with support for the Microsoft Windows ribbon toolbar. Dockable and floatable windows, plus concealable ribbon toolbars, improve display utilization.
“NanoScan is ideal for profiling CO2 beams used in material processing,” said Gary Wagner, general manager, Ophir Photonics. “The scanning-slit technology provides the easiest-to-use profiling because it can measure most high power beams without the need for complicated attenuation schemes. Combine that with the new user interface and now users can see their laser beams as never before.”
NanoScan v2 supports both the 64-bit and 32-bit versions of Windows 7. Detector options (silicon, germanium, and pyroelectric technologies) allow measurement at wavelengths from the ultraviolet to the far infrared. It can simultaneously measure multiple beams and offers an optional power meter for scanheads with silicon and germanium detectors.
For more information, visit Ophir Photonics.
Sources: Press materials received from the company and additional information gleaned from the company’s website.