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Nikon Metrology and Verisurf Team Up

By DE Editors

Nikon Metrology and Verisurf Software have joined forces to make it possible for manufacturers to drive all Nikon Metrology portable metrology devices from Verisurf’s common software platform. Supported Nikon Metrology devices include the Laser Radar, K-Series optical CMMs configured with scanners and probes, MCA II articulated arm configured with scanners and probes, and the iGPS.

“Verisurf is proud to partner with Nikon Metrology and offer engineers a major breakthrough in measurement and inspection,” says Ernie Husted, president of Verisurf. “Having advanced inspection software that can be used with all of their metrology devices will dramatically increase efficiency. Manufacturers will save countless hours otherwise spent learning and using multiple software interfaces, while significantly reducing software maintenance and technical support costs.”

“This partnership is a huge benefit to our metrology customers,” says Doug Kappler, director of Nikon Metrology Large Scale Division. “In addition to being able to offer a single software platform for all Nikon Metrology portable metrology devices, the software provides fully automated and programmable measurements.”

Verisurf’s new X platform is the latest release of its computer-aided inspection and reverse engineering software. The X platform gives engineers new device interfaces, improved inspection guidance functionality and feature extraction for reverse engineering. An updated VDI has added new non-contact measurement and automation controls for the Nikon Metrology Laser Radar.

For more information, visit Nikon Metrology and Verisurf.

Sources: Press materials received from the company and additional information gleaned from the company’s website.

About DE Editors

DE's editors contribute news and new product announcements to Desktop Engineering. Press releases can be sent to them via DE-Editors@deskeng.com.
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