Mesuro launched a new test solution for device characterization. The new offering utilizes an "envelope load pull technique," along with the latest generation of commercial off-the-shelf PXI hardware and LabVIEW system design software from National Instruments, to provide rapid test scenarios to be run on the device under test.
The new Rapid Load Pull product can replace traditional passive tuning networks within load pull test systems, the company says. The way in which the Rapid Load Pull solution fits into the test environment allows for the existing measurement hardware to be re-used within the improved test station. The system can be supplied as a turnkey project to include the NI portion with Mesuro Software/Coupler/Amplifier, or can be customer assembled. The system is currently available covering frequency ranges up to 4.4GHz.
The device output is measured on the receiver elements via the coupler, with the output then being down-converted to baseband. The loop algorithm, implemented in the LabVIEW FPGA Module, then calculates the required settings to form the reflected signal that is then presented to the device under test, based upon the requested impedance. The loop amplifier provides the active element to ensure that the loop can tune the impedance to any desired point on the Smith Chart. The NI PXI solution contains an embedded controller, on which the main Mesuro test software resides and operates. The system can perform all the required load pull tests, and the data can be viewed within the measurement software or exported for use within EDA or other tools by the user.
For more information, visit Mesuro.
Sources: Press materials received from the company and additional information gleaned from the company's website.