Mitutoyo America announced the release of the new Quick Vision WLI vision measuring machine. The unit includes an optical vision head, and also incorporates a white light interferometer (WLI) head. Together, these heads enable high accuracy performance of non-contact vision plus non-contact 3D measurement of high aspect-ratio minute form (Z = Sub µm ~ 100 µm) functions in a single machine, the company says.
According to Mitutoyo, the machine offers a significant throughput improvement for non-contact measurement of items combining both 2D and minute form 3D features in a single workpiece. Example subjects could include IC chips and packages, hybrid chassis, lead frames, and many types of precision machined and molded parts.'
The interferometer head splits a beam of white light in two; one beam goes towards a reference mirror and the other beam goes to the workpiece. As the reference objective is moved along the Z-axis, a white "interference ring" is observed on the focus point; analysis of this ring makes it possible to determine the 3D shape of the feature under observation.
It performs 2D/3D form evaluation using Mitutoyo FORMPAK-QV/FORMTRACEPAK-PRO software, which features a refined, intuitive GUI. Results can be displayed in 2D/3D graphics, and a variety of editing and control tools are standard.
In addition, the machines can support output to measurement data applications such as MeasurLink, Mitutoyo's proprietary statistical-processing and process-control program, which performs statistical analysis and provides real-time display of measurement results for SPC applications.
For more information, visit Mitutoyo America.
Sources: Press materials received from the company and additional information gleaned from the company's website.